Part 1 Papers by STC’s

STC P

Papers

16:00–16:30 Measurement of spindle-related geometric errors by multilateration

Kotaro Mori (2), Masahiro Shimoike, Keito Abe

Room: M8
Paper ID: P-1
Day: 18 Mon

16:30–17:00 Traceability and uncertainty of defects automated measurements by CNN-powered Machine Vision Systems

Giacomo Maculotti, Lorenzo Giorio, Gianfranco Genta, Maurizio Galetto (2)

Room: M8
Paper ID: P-2
Day: 18 Mon

17:00–17:30 Transferability of compliance error compensation parameters in articulated robots

Monica Katherine Gonzalez, Theodoros Laspas, Hung-Ching Lin, Kanako Harada, Andreas Archenti (2)

Room: M8
Paper ID: P-3
Day: 18 Mon

17:30–18:00 Comparison of measuring methods for the dimension-over-balls parameter MdK using modified gear standards

Anke Guenther (2), Gert Goch (1)

Room: M8
Paper ID: P-4
Day: 18 Mon

09:00–09:30 (Keynote) Dimensional metrology based on ultrashort pulse laser and optical frequency comb

Wei Gao (1), Seung-Woo Kim (1), Harald Bosse (3), Kaoru Minoshima

Room: M7
Paper ID: P Kn (Keynote)
Day: 20 Wed

09:30–10:00 Frequency-comb-referenced Terahertz Fabry-Pérot interferometry for monitoring semiconductor wafer thinning process with a nanometer precision

Guseon Kang, Jaeyoon Kim, Jun Hyung Park, Sukkyung Kang, Dong Geun Kim, Young-Jin Kim (2)

Room: M7
Paper ID: P-5
Day: 20 wed

10:30–11:00 Multiscale optical surface integrating multifocal imaging and wavelength filtering for compact snapshot spectral imaging

Xinquan Zhang (2), Yaoke Wang, Hao Wu, Limin Zhu, Ping Guo (2)

Room: M7
Paper ID: P-6
Day: 20 Wed

11:00–11:30 A non-Michelson type three-axis grating interferometer using linear scale gratings

Ryo Sato, Yifan Hong, Hiraku Matsukuma, Wei Gao (1)

Room: M7
Paper ID: P-7
Day: 20 Wed

11:30–12:00 Three-dimensional measurement of structures with smooth-steep-surfaces using autofluorescence confocal signal

Masaki Michihata, Motoya Yoshikawa, Shuzo Masui, Satoru Takahashi (1)

Room: M7
Paper ID: P-8
Day: 20 Wed

13:30–14:00 Spectral imaging for 2-D wavelength mapping by chromatic phase retardation

Ki-Nam Joo, Seongwook Jang / S.-W. Kim (1)

Room: M7
Paper ID: P-9
Day: 20 Wed

14:00–14:30 Local heat transfer detection via passive dual probe near-field microscopy

Yusuke Kajihara (2), Ryoko Sakuma, Yoshiki Nagai, Kuan-Ting Lin

Room: M7
Paper ID: P-10
Day: 20 Wed

14:30–15:00 Investigation of the correlation between radiographic image quality and surface measurement quality of XCT using frequency response analysis

Xiao Chen, Shan Lou, Wenjuan Sun, Paul Scott, Xiangqian Jiang (1)

Room: M7
Paper ID: P-11
Day: 20 Wed

15:00–15:30 Investigating the effects of machine learning generalisation for enhancing accuracy in fast X-ray computed tomography for industrial metrology

Filippo Zanini, Nicolò Bonato, Diego Pentucci, Simone Carmignato (1)

Room: M7
Paper ID: P-12
Day: 20 Wed

16:00–16:30 X-oscillation-coordinated fly-cutting of highly uniform microlens arrays

Zhiwei Zhu, Tianxiao Chang, Rongjing Zhou, Peng Huang / W.S. Lau (1)

Room: M7
Paper ID: P-13
Day: 20 Wed

16:30–17:00 Ultra precision analytical toolpath calculation for aspherical mirror surface machining

Eloïse Jeanroy, Julien Chaves-Jacob, Jean-Marc Linares (1), Santiago Arroyave-Tobon, Stephan Imperiali

Room: M7
Paper ID: P-14
Day: 20 Wed

17:00–17:30 In-process reconstruction of 3D surface profile for ultra-precision cutting of microstructured surfaces from cutting force monitoring and compensation

Liang An, Yuan-Liu Chen (2), Zhongwei Li, Genshen Liu

Room: M7
Paper ID: P-15
Day: 20 Wed